• Reflectivity, Film thickness, Object color, and transmittance measured in seconds
• Wide range of wavelength from 380 to 1050 nm
• Measures reflectivity on curved surface without contact

Measure the reflectivity of a minute area with a diameter ranging from 17 to 70 um

Optical Path of Reflectivity Measurement

Example of reflectivity measurement : lens

Example of reflectivity measurement : lens curvature

Film Thickness Measurement Screen-shot

Object Color Measurement Screen-shot

Display an XY chromaticity diagram, an L*a*b* chromaticity diagram, and their related numeric values based on reflectivity data.

Measure the transmittance of a plane sample by transmitting 2 mm parallel beams of lights through the sample to the spectrophotometry acceptance elements.

Optical Path of Transmittance Measurement

Measure the reflectivity at an incidence angle of 45 degrees by reflecting 2 mm parallel beams of lights to the spectrophotometry acceptance elements.

Optical Path of 45-degree Reflectivity Measurement

Quick, high repeatability measurements can be achieved in seconds using a flat field grating, line sensor and high-speed spectrophotometry.

Optical system image

Olympus has designed a new dedicated objective lens that provides non-contact measurements across an area of 17 to 70 ?m diameters. The new lens provides high repeatability on even curved surfaces or minute electronic parts.

Image of reflectivity measurment

Accurate measurement of surface reflectivity can be performed without the costly steps needed to prevent rear surface reflection. Rear surface-reflected light is reduced by means of special optics that block all out-of-focus light reflection similar to a confocal system. Whether your optical component is spherical,aspherical or flat, the USPM-RU-W does not require sample preparation through anti-reflection treatments.

Principle of backside reflection elimination

The single-layer or multi-layer film thickness can be analyzed according to the measured spectral reflectivity data. You can select the optimum measurement method for the application.

Peak-valley Method

Peak valley film thickness analysis result

This method is used to calculate film thickness based on the periods between the peaks and valleys of the measured spectral reflectivity value, and is effective for measuring single-layer film. No complicated settings are required, so measuring film thickness is easy.

Fourier Transform Method

Fourier transform film thickness analysis result

This method is used to calculate film thickness based on the periods between measured spectral reflectivity values, and is effective for measuring single-layer and multilayer films. The Fourier transform method eliminates noise, thus making analysis possible when it is difficult to detect peak and valley values.

Curve Fit Method

Curve fitting film thickness analysis result

This method is used to calculate film thickness by estimating which structure has the smallest difference between the measured spectral reflectivity and the calculated reflectivity for that structure, and is effective for measuring single-layer and multilayer films. The curve fit method also makes it possible to analyze thin film in which peak and valley values are not apparent.

Satisfies Diverse Measurement Needs at High Speed and With High Precision

Evaluation of Lens Coating for reflectivity,color and film thickness.

/

Mobile Phone Camera Lenses
Projector Lenses
Digital Camera Lenses
Spectacle Lenses

Examining the Reflectivity and Film Thickness of Minute Electronic Parts.

LED Packages
Printed Circuit Boards

Reflectivity, Film Thickness and Transmittance measurment of Planar Optical Elements.

LCD color filters
Optical Films

Optical Elements Reflectivity at an Incident Angle of 45 Degrees.

Prisms
Mirrors