Olympus STREAM

Image Analysis Software

OLYMPUS Stream software offers intelligent step-by-step workflows to acquire sharp, crisp images that are ready for quantitative measurements and professional reporting based on the latest standards. Users of any experience level can conduct complex image analysis tasks, from image acquisition to standard reporting, under any imaging condition.

Features

Easy-to-Use Interface And Step-by-Step Guidance

Smart Technologies for Crisp Image Capture

Tools for live images
Panorama and extended depth focus
Recall acquisition settings

Save Time on Repeated Tasks

Guided operation
Quantitative information
Automatic tools for efficient image acquisition
Efficient report creation

Designed For Olympus Hardware

Seamlessly Integrates with Olympus Optical Microscopes

Upright microscopes
Inverted microscopes
Semiconductor microscopes
Stereo microscopes
LEXT 3D measuring laser microscope
DSX digital microscope

Works with Most Olympus Digital Cameras

Color fidelity
High resolution
Real-time on-screen imaging

Dedicated Observation Methods

HDR imaging for improved image contrast
MIX observation to visualize a sample’s surface structure

Solving Your Inspection Challenges

Advanced Imaging Solutions

Count and measure solution
Three-dimensional measurement and line profiles

Solutions for Metallography (Metal / Casting Industries)

Grain sizing using the intercept counting method
Grain sizing using the planimetric method
Graphite nodularity evaluation
Rating the non-metallic inclusion content in high-purity steel
Comparison of sample images with reference standards

Solutions for Machinery Processing (Automotive / Machined Parts Industries)

Welding distortion
Phase and region of interest measurement
Particle distribution

Solutions for Electronics (Electronic Device / Semiconductor Industries)

Throwing power measurement
Automatic critical dimension measurement

Solutions for Surface Coatings and Thin Film Deposits (Coating Industries)

Thin coating thickness evaluation (calotest method)
Layer thickness measurement
Pore fraction and density measurement

Specification

: Standard : Optional		Start	Basic	Essentials	Motion	Desktop
Image Acquisition	Basic image acquisition including HDR and auto-calibration of magnification and Live HDR1, and position navigation¹
	Software autofocus^*2 and movie acquisition (Avi format)
	Time lapse, Instant EFI, and Instant/Manual MIA^*3
	Motorized EFI/MIA and Z-stack acquisition
	Remote live view (NetCam)
Image and Customization Tools	Basic tool windows (Image history, properties, navigator, gallery view tool window)^*4
	Annotations, layer management, scale bar, cross hair, info stamp display, and image filters
	Digital reticle/grid, line profile display, My Function, layout management, and Macro Manager
Measurements/ Image Analysis	Basic interactive measurement (distance, angles, rectangles, circles, ellipses, polygons, circle-to-circle distance, angle ruler, and line ruler) and data export to MS-Excel
	Phase analysis, magic wand, freehand polyline, interpolated polygon, morphology filter, and image arithmetics
	3D measurements, 3D profile measurements, and 3D surface view
Reporting*⁵	Report creation (MS-Word, and MS-Excel formats)
Reporting*⁵	Presentation creation
Data Management	Stream document storage^*6
Data Management	Workgroup Database with structured data format
Device Support	Olympus microscopes^7 and Olympus cameras^8
	Non-Olympus cameras and image source converter^*9
	Non-Olympus stage controller^*9

PC Requirements
CPU	Intel Core 2 Duo or higher (Intel Core i5, i7 recommended)
RAM / Hard disk / DVD drive	3 GB or more (8 GB recommended)/2.4 GB or more free space/DVD+R DL compatible
OS*¹⁰	Windows 10 Pro (32-bit/64-bit) , Windows 8.1 (32-bit/64-bit) Pro, Windows 7 (32-bit/64-bit) Ultimate with SP1, Windows 7 (32-bit/64-bit) Professional with SP1
.NET Framework	Version 4.5.2 or 4.6.1
Graphic card*¹¹	1280 × 1024 monitor resolution with 32-bit video card
Web browser	Windows Internet Explorer 8, 9, 10, or 11

*1 Requires the DP74 camera, and the Live HDR function requires 64-bit OS.
*2 Requires Olympus microscope with motorized Z-axis or external motorized Z-axis with OLYMPUS Stream Motion or Automation Solution
*3 Instant MIA may not work properly with some cameras
*4 Write and read all major file formats and open Olympus proprietary formats (DSX, LEXT and POIR file formats)
*5 Requires Microsoft Office 2016, 2013 (SP1) or 2010 (SP2)
*6 Using Microsoft SQL Server Express
*7 Supports MX61A, MX61, MX61L, MX61A, MX63L, MX63, GX53, BX3M-CB, BX3M-CBFM, BX-UCB, BX-REMCB, IX-UCB, SZX-MDCU, SZX2-MDCU, U-CBS, STM7.
*8 Supports DP21, DP22, DP26, DP27, DP73, DP74, LC20, LC30, SC30, SC50, SC100, SC180, UC30, UC50, UC90, XC10, XC30, XC50, XM10.
*9 Please contact Olympus for supported device information
*10 The DP74 supports Windows 10/8.1 (64-bit) and Windows 7 (32-bit/64-bit). The DP73 supports Windows 8.1/7 (64-bit). The SC180/UC90 support Windows 10/8.1/7 (64-bit).
*11 Required configurations for LiveHDR in DP74. Graphic board applicable to CUDA made by NVIDIA (compute capability 2.1 or higher). Graphic board driver applicable to CUDA 7.0 or higher.

Special Solution Specifications

Solutions	Compatiblity			Functions
Solutions	Basic/ Essentials	Motion	Desktop	Measurement Type
3D		Included	Partially included^*	3D Surface View, 3D Measurement, 3D Profile Measurement, Motorized Z-stack/EFI, Instant EFI with height map (requires coded or motorized Z-axis).
Automation		Included		Automation Solution (Motorized/Manual/Instant MIA, Motorized/Instant EFI without height map (requires coded or motorized XYZ-axis) and with time lapse.
Weld Measurement				Weld Measurement solution (measurements for geometric distortion introduced by the heating during welding).
Count & Measure				Multiple threshold methods are available (automatic, manual HSV, manual and adaptative) The system can automatically measure multiple parameters on all segmented objects (Area, Aspect Ratio, Bisector, Bounding Box, Gravity Center, ID, Mass Center, Intensity Values, Convexity, Diameters, Elongation, Feret, Extent, Next Neighbor Distance, Orientation, Perimeter, Radius, Shape, Sphericity, etc.) Spreadsheet and charts with individual and distribution measurements.

* Not possible to use the functions relating to image acquisition

Materials Solutions Specifications

Solutions	Compatiblity			Output
Solutions	Basic	Essentials/ Motion	Desktop	Automatic report creation	Workbook with individual measurement	Store all results in the image properties
Grain Intercept
Grain Planimetric					^*2
Inclusion Worst Field
Cast Iron
Chart Comparison
Layer Thickness
Coating Thickness
Automatic Measurements
Throwing Power
Porosity
Particle Distribution
Advanced Phase Analysis		Included	Included

Solutions	Functions
Solutions	Measurement type	Supported standards	Multiple stage location^1 Sample alignment^1
Grain Intercept	Selection of pattern (circles, cross, cross & circles, vertical lines, horizontal lines, horizontal & vertical lines) Definition of the number of test lines for determination of grain elongation Displays the G-value in the Material Solution tool window	ISO 643: 2012, JIS G 0551: 2013, JIS G 0552: 1998, ASTM E112: 2013, DIN 50601: 1985, GOST 5639: 1982, GB/T 6394: 2002
Grain Planimetric	Automatic extraction of grain boundaries User interaction using Stream sliders for improved usability Displays the G-value histogram in the Material Solution and position navigation^*1 for direct interaction	ISO 643: 2012, JIS G 0551: 2013, JIS G 0552: 1998, ASTM E112: 2013, DIN 50601: 1985, GOST 5639: 1982, GB/T 6394: 2002
Inclusion Worst Field	Automatic detection of non-metallic inclusion using colors, shape, and size Automatic classification of oxides, sulfides, silicates, and aluminates Live display of the detected inclusion with its rating	ISO 4967 (method A): 2013, JIS G 0555 (method A): 2003, ASTM E45 (method A): 2013, EN 10247 (methods P and M): 2007, DIN 50602 (method M): 1985, GB/T 10561 (method A): 2005, UNI 3244 (method M): 1980
Cast Iron	On polished samples: automatically measures the characteristics of the graphite content (size, shape, and distribution) On etched samples: measures the ferrite to pearlite ratio Integrated workflow that takes into account the sample status (etched or polished)	ISO 945-1: 2010, ISO 16112: 2017, JIS G 5502: 2001, JIS G 5505: 2013, ASTM A247: 17, ASTM E2567: 16a, NF A04-197: 2004, GB/T 9441: 2009, KS D 4302: 2006
Chart Comparison	Multiple displays available, including live overlay User interaction using Stream sliders for improved usability Calculates statistics on the selected values	ISO 643: 1983, ISO 643: 2012, ISO 945: 2008, ASTM E 112: 2004, EN 10247: 2007, DIN 50602: 1985, SEP 1572: 1971, SEP 1520: 1998, ISO 4505:1978
Layer Thickness	Layer boundaries can be specified using automatic detection, magic wand, or manual mode (using 2 or 3 points). Individual measurements can be added or deleted later on Measurement of any type of layers (with even or uneven boundaries) is supported. Layer thickness measurement calculates mean, maximum, and minimum values as well as statistical data for each individual layer.
Coating Thickness	Prints are measured from top view Calculation of the coating thickness according to the sample geometry	EN 1071: 2002, VDI 3824: 2001
Automatic Measurements	Automatically measures distances (point-to-point, point-to-line, circle-to-circle, point-to-circle, line-to-circle) Automatically measures circle diameter (roundness, bounding box) Automatically measures angles between two lines Definition of tolerances values for measurement and visual validation Expert and user mode for measurement repeatability
Throwing Power	Manual measurements of selected point of interest on the sample Predefined points that will be triggered by the operator Selection of the vias type and documentation of the analysis Report and automatic calculation according to the manual measurements
Porosity	Pore detection per ROIs (triangle, circle, rectangle, polygon, or magic wand) with overlapping capability Measurement of the pore density, count, and specific area Measurement of the biggest pore Measurement of a specified size range
Particle Distribution	Particles are defined using simplified threshold settings. Automatic classification according to a selected parameter (size, color, or shape) Measurement of ROIs and multiple thresholds Definition of validation and coding according to user-defined standards
Advanced Phase Analysis	Phase fraction per ROIs (triangle, circle, rectangle, or polygon) Magic wand, freehand polyline, interpolated polygon, morphology filter, and image arithmetics also usable Measurement of the total phase percentage per phase and per ROI Selectable minimum area detection

*1 Possible with OLYMPUS Stream Motion and other Stream packages with Automation solution
*2 Stream chart with the distribution can be output